Essays about: "BIST"

Showing result 1 - 5 of 11 essays containing the word BIST.

  1. 1. Design and implementation of testable fault-tolerant RISC-V system

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Mattias Rodan; [2020]
    Keywords : Testable; MBIST; Fault-tolerant; ECC; RISC-V; Technology and Engineering;

    Abstract : This thesis aims to investigate and implement a fault-tolerant energy-efficient RISC-V based system on chip (SoC). Key features of the SoC is the testabil- ity and reliability of the low power on-chip embedded memories. READ MORE

  3. 2. BIST Implementation Access through A Reconfigurable Network

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Yaojie Lu; [2019]
    Keywords : Technology and Engineering;

    Abstract : .... READ MORE

  4. 3. Access-rate guaranteed memory controller

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Berta Morral Escofet; [2018]
    Keywords : Technology and Engineering;

    Abstract : On-chip memory plays an important role in system-on-chip (SoCs) being in most cases the dominant part in both area and power. Additionally, it determines the overall system's speed. As a result, new memory architectures and technologies have been developed over the years in order to improve the overall system performance. READ MORE

  5. 4. RF BiST för att detektera IQ-imbalanser avseende överhörningseffekter för avancerade antennsystem

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Kishore Khed; [2018]
    Keywords : Technology and Engineering;

    Abstract : Internet of Things (IoT) is a network constituted by uniquely identifiable commodity objects or devices equipped with some sensing system. To achieve high data rates required for IoT devices, a modern wireless communication system, known as Advanced Antenna Systems(AAS), leads to significant improvement, by increasing not only the data rate but also spectrum efficiency and the channel capacity. READ MORE

  6. 5. Integration of a Digital Built-in Self-Test for On-Chip Memories

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Xiao Luo; Masoud Nouripayam; [2017]
    Keywords : BIST SRAM verification test self-test dual-port ASIC; Technology and Engineering;

    Abstract : The ability of testing on-chip circuitry is extremely essential to ASIC implemen- tations today. However, providing functional tests and verification for on-chip (embedded) memories always poses a huge number of challenges to the designer. READ MORE