Essays about: "DUT"

Showing result 1 - 5 of 25 essays containing the word DUT.

  1. 1. FPGA programming with VHDL : A laboratory for the students in the Switching Theory and Digital Design course

    University essay from Högskolan i Halmstad

    Author : Samaneh Azimi; Safia Abba Ali; [2023]
    Keywords : FPGA Field-Programmable Gate Arrays VHDL Very High-Speed Integrated Circuits HDL Hardware description language LUT Look-up-table CLB Configurable Logic Blocks MUX Multiplexers IOB Input Output Blocks DUT Device under the test ASIC Application-specific integrated circuits SOC System on chips RTL Register Transfer Language;

    Abstract : This thesis aims to create effective and comprehensive learning materials for students enrolled in the Switching Theory and Digital Design course. The lab is designed to enable students to program an FPGA using VHDL in the Quartus programming environment to control traffic intersections with sensors and traffic signals. READ MORE

  2. 2. Investigating Machine Learning for verification of AMBA APB protocol.

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Abhiram Srisai Kishore; Mohammed Wasim; [2022]
    Keywords : Machine learning; SOC Verification; AMBA; Neural Networks; Deep Learning; Assertions.; Technology and Engineering;

    Abstract : It is a well-known fact that in any Application Specific Integrated Circuit (ASIC) design, verification consumes most time and resources. And when it comes to huge designs, finding bugs can be tedious given the area and the complexity. As per Moore’s law, the design complexity is increasing exponentially due to the growing demand for performance. READ MORE

  3. 3. Development of Test Methodology for Electromechanical Linear Actuators

    University essay from Uppsala universitet/Signaler och system

    Author : Isak Linder; [2022]
    Keywords : Electromechanical; linear actuator; test methodology; test rig; rack and pinion; transport delay; latency; spring mass damper; load cell; load force; load unit; test unit; DUT; PID; PID control; control mechanics; cogging torque; torque; flex; stiffness; current saturation; torque control;

    Abstract : This master thesis aims to develop a test methodology for electromechanical linear actuators. A linear actuator acts as a linear motor, converting a power source to linear motion. The electromechanical linear actuator in this project has an electric motor as its power source and uses a rack and pinion system to transfer that power to linear motion. READ MORE

  4. 4. Validation of efficiency of formal verification methodology for verification closure

    University essay from KTH/Skolan för elektroteknik och datavetenskap (EECS)

    Author : Gautham Prabhakar; [2022]
    Keywords : UVM; formal verification; assertions; verification engineers; SVA; TLV; jasper gold; UVM; formell verifiering; assertions; verifierar; SVA; TLV; jasper gold;

    Abstract : Application Specific Integrated Circuits (ASIC) and Field Programmable Gate Arrays (FPGA) verification is quite a time consuming phase in design flow cycle and it can be done using methodologies such as Universal Verification Methodology (UVM) and formal verification.The UVM methodology is simulation based verification where in the verifier will have to trigger the Design Under Test (DUT) manually by writing sequences which target different features of the DUT and the verification environment can also have verification directives such as assertions to spot design bugs. READ MORE

  5. 5. Gate driver solutions for high power density SMPS using Silicon Carbide MOSFETs

    University essay from Mittuniversitetet/Institutionen för elektronikkonstruktion

    Author : Farhan Akram; [2021]
    Keywords : SiC MOSFETs; Gate drivers; DC-DC converter; High power and efficiency power supplies;

    Abstract : Discrete silicon carbide (SiC) power devices have unique characteristics that outpace those of silicon (Si) counterparts. The improved physical features have provided better faster switching, greater current densities, lower on-resistance, and temperature performances. READ MORE