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1. 1. Highly Linear Mixer for On-chip RF Test in 130 nm CMOS

   University essay from Institutionen för systemteknik

   Author : Ghulam Mehdi; [2007]
   Keywords : ;

   Abstract : The complexity of wireless communication integrated circuits is increasing day by day due to the trend of multifunction and multistandard support. This has not only increased the production cost of these RFICs but the testing cost is also increased significantly, as much advanced test equipments and instruments are needed to carry out the sophisticated performance tests. READ MORE