Essays about: "IEEE P1687"

Found 2 essays containing the words IEEE P1687.

  1. 1. Test Scheduling with Power and Resource Constraints for IEEE P1687

    University essay from Institutionen för datavetenskap; Tekniska högskolan

    Author : Golnaz Asani; [2012]
    Keywords : IJTAG; IEEE P1687; Test Time Calculation; Test Scheduling; Resource Constraints; Power Constraints;

    Abstract : IEEE P1687 (IJTAG) is proposed to add more exibility|compared with IEEE 1149.1 JTAG|for accessing on-chip embedded test features called instruments. This exibility makes it possible to include and exclude instruments from the scan path. To reach a minimal test time, all instruments should be accessed concurrently. READ MORE

  3. 2. Analysis and Optimization for Testing Using IEEE P1687

    University essay from ESLAB - Laboratoriet för inbyggda system

    Author : Farrokh Ghani Zadegan; [2010]
    Keywords : IEEE P1687; IJTAG; Test Architecures; Test Time Calculation; Design Automation; Test Time Optimization;

    Abstract :  The IEEE P1687 (IJTAG) standard proposal aims at providing a standardized interface between on-chip embedded test, debug and monitoring logic (instruments), such as scan-chains and temperature sensors, and the Test Access Port of IEEE Standard 1149.1 mainly used for board test. READ MORE