Essays about: "IEEE Standard 1241"

Found 1 essay containing the words IEEE Standard 1241.

  1. 1. Built-in self-test of analog-to-digital converters in FPGAs

    University essay from Linköpings universitet/Elektroniksystem

    Author : Petter Nilsson; [2014]
    Keywords : FPGA; BIST; ADC; dynamic test; static test; linearity; DNL; INL; offset; gain error; FFT; SNR; THD; delta-sigma; sigma-delta; DAC; high-level synthesis; HLS; IEEE Standard 1241;

    Abstract : When designing an ADC it is desirable to test its performance at two different points in the development process. The first is characterization and verification testing when a chip containing the ADC has been taped-out for the first time, and the second is production testing when the chip is manufactured in large scale. READ MORE