Essays about: "IJTAG"
Found 3 essays containing the word IJTAG.
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1. Reconfigurable Instrument Access Network with a Functional Port Interface
University essay from Lunds universitet/Institutionen för elektro- och informationsteknikAbstract : The ever-increasing need for higher performance and more complex functionality pushes the electronics industry to find a faster and more efficient way to test and debug an Integrated Circuit (IC). Currently, the IEEE Std. 1149.1, known as Joint Test Action Group (JTAG) is considered as state of the art by the industry. READ MORE
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2. Test Scheduling with Power and Resource Constraints for IEEE P1687
University essay from Institutionen för datavetenskap; Tekniska högskolanAbstract : IEEE P1687 (IJTAG) is proposed to add more exibility|compared with IEEE 1149.1 JTAG|for accessing on-chip embedded test features called instruments. This exibility makes it possible to include and exclude instruments from the scan path. To reach a minimal test time, all instruments should be accessed concurrently. READ MORE
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3. Analysis and Optimization for Testing Using IEEE P1687
University essay from ESLAB - Laboratoriet för inbyggda systemAbstract : The IEEE P1687 (IJTAG) standard proposal aims at providing a standardized interface between on-chip embedded test, debug and monitoring logic (instruments), such as scan-chains and temperature sensors, and the Test Access Port of IEEE Standard 1149.1 mainly used for board test. READ MORE