Essays about: "VLSI Test"
Found 5 essays containing the words VLSI Test.
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1. A Continuous-Time ADC and DSP for Smart Dust
University essay from Elektroniksystem; Tekniska högskolanAbstract : Recently, smart dust or wireless sensor networks are gaining more attention.These autonomous, ultra-low power sensor-based electronic devices sense and process burst-type environmental variations and pass the data from one node (mote) to another in an ad-hoc network. READ MORE
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2. Reduction of Simultaneous Switching Noise in Analog Signal Band on a Chip
University essay from Institutionen för systemteknikAbstract : In the era of VLSI the technological advancements have lead us to integrate not only digital circuits of high device density but both digital and analog circuits on to the same chip. In recent years the number of devices on a chip has spectacularly increased, all because of the downward scaling in sizes of the devices. READ MORE
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3. Evaluation of Hardware Test Methods for VLSI Systems
University essay from Institutionen för systemteknikAbstract : The increasing complexity and decreasing technology feature sizes of electronic designs has caused the challenge of testing to grow over the last decades. The purpose of this thesis was to evaluate different hardware test methods/approaches based on their applicability in a complex SoC design. READ MORE
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4. Implementation of an Active Pixel Sensor with Shutter and Analog Summing in a 0.35um Process
University essay from Institutionen för systemteknikAbstract : An integrated circuit for evaluation of APS technology has been implemented in a 0.35 um process. The APS features snapshot operation and the readout circuitry can carry out: CDS, DS, and analog summing all in one circuit that is fully programmable. READ MORE
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5. TIR, design and testing of a Simple GALS
University essay from Institutionen för systemteknikAbstract : Globally-asynchronous locally-synchronous (GALS) systems may become a solution for nowadays challenges in the field of VLSI design. Fully synchronous chips are becoming not feasible anymore due to clock distribution and power consumtion problems. READ MORE
