Essays about: "ic testing"

Showing result 1 - 5 of 16 essays containing the words ic testing.

  1. 1. Implementation and Comparative Analysis of Head-Related and Binaural Room Impulse Response in a Mid-Side Decomposition

    University essay from KTH/Teknisk akustik

    Author : Jonathan Ling; [2023]
    Keywords : Master’s Thesis; Spatial audio; Sound Externalisation; Binaural recording; Headphones; Mid-Side Processing; Masteruppsats; Rumsligt Ljud; Ljud-externalisation; Binaural Inspelning; Hörlurar; Mid-Sid processering;

    Abstract : This thesis aimed to clarify the essential factors involved in externalising audio over headphones. Extensive research was conducted, examining binaural cues and the latest advancements in the field. A novel approach was proposed, which applied HRIRs and BRIRs on a Mid-Side decomposition. READ MORE

  3. 2. Analysis of high-voltage low-current DC/DC converters for electrohydrodynamic pumps

    University essay from Uppsala universitet/Institutionen för elektroteknik

    Author : Sigge Axelsson; Jonas Gartner; Axel Stafström; [2023]
    Keywords : high-voltage; low-current; low-power; DC DC; DC-DC; high-gain; converter; electrohydrodynamic pump; EHD; transformerless converter; Royer-based converter; resonant Royer oscillator; Cockroft-Walton voltage multiplier; CWVM; voltage multiplier; series-connected positive-negative voltage multiplier; SPNVM; planar air-core transformer; planar transformer; high-freqency Royer-based converter; overcurrent protection; LT8331; gallium nitride; GaN; planar PCB-integrated transformers;

    Abstract : Moving parts cause vibrations and tend to wear out. In applications where maintenance is complicated, solutions without moving parts are therefore advantageous. Electrohydrodynamic pumps are such a solution. Instead of mechanical propulsion, they use strong electric fields to induce movement in a dielectric cooling liquid. READ MORE

  4. 3. PCBA verification and fault detection using a low-frequency GMR-based near-field probe with magnetic closed-loop feedback compensation : A non-contact alternative to physical probing

    University essay from KTH/Skolan för elektroteknik och datavetenskap (EECS)

    Author : Joacim Sundh; [2022]
    Keywords : GMR; sensor; magnetic field; near-field; probe; linearity; PCB; coil; PCBA; analogue integrated circuits; analog; operational amplifiers; electrical fault detection; feedback circuits; in-circuit tests; GMR; sensor; magnetfält; närfält; sond; linjäritet; mönsterkort; spole; kretskort; analoga integrerade kretsar; operationsförstärkare; elektrisk feldetektering; återkopplingskretsar; kretskortstest;

    Abstract : As electronics are getting both smaller and more advanced, the need to verify and validate remains and the means are getting more complex the more functions and components are added. Traditionally, in-circuit tests (ICTs) are performed by probing dedicated test points on the Printed Circuit Board Assembly (PCBA) in a test sequence that is unique to each product. READ MORE

  5. 4. Exploration of formal verification in GPU hardware IP

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Nishant Gupta; [2019]
    Keywords : Formal Verification; JasperGold; Hardware Verification; Technology and Engineering;

    Abstract : Today, digital circuits are part of every ones daily life in form of mobile phones, computers, television, smart cards etc. The advent of new technologies such as internet of things, 5G etc. are continuously making the digital circuits more and more complex in design. READ MORE

  6. 5. Test and Repair of Reconfigurable On-chip Instrument Access Networks

    University essay from Lunds universitet/Institutionen för elektro- och informationsteknik

    Author : Zehang Xiang; [2019]
    Keywords : reconfigurable network; Test and repair of reconfigurable scan network; scan register; Technology and Engineering;

    Abstract : As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become harder to avoid malfunctioning. Embedded instruments are increasingly used to test, tune, and configure the transistors in ICs. IEEE Std.1149. READ MORE