Essays about: "thesis on design of adpll"
Found 4 essays containing the words thesis on design of adpll.
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1. A Low Noise Digitally Controlled Oscillator for a Wi-Fi 6 All-Digital PLL
University essay from KTH/Skolan för elektroteknik och datavetenskap (EECS)Abstract : Following the rise of Internet of Things (IoT), or just the technological advancements and expectations in a world where the things are or will be connected, new demands are put on Integrated Circuit (IC) for wireless connectivity. The use cases seem endless; smart home, healthcare, entertainment, and science are all areas that can benefit from connectivity of low power electronics. READ MORE
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2. Digitally Controlled Oscillator for mm-Wave Frequencies
University essay from Lunds universitet/Institutionen för elektro- och informationsteknikAbstract : In the fifth generation of mobile communication, 5G, frequencies above 30 GHz, so-called millimeter-wave (mm-wave) frequencies are expected to play a prominent role. For the synthesis of these frequencies, the all-digital phase locked loop (ADPLL) has recently gained much attention. READ MORE
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3. Quantization Effects Analysis on Phase Noise and Implementation of ALL Digital Phase Locked-Loop
University essay from KTH/Skolan för informations- och kommunikationsteknik (ICT)Abstract : With the advancement of CMOS process and fabrication, it has been a trend to maximize digital design while minimize analog correspondents in mixed-signal system designs. So is the case for PLL. PLL has always been a traditional mixed-signal system limited by analog part performance. READ MORE
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4. Modeling and Characterization of an All-Digital Phase-Locked Loop
University essay from Institutionen för teknik och naturvetenskapAbstract : The thesis "Modeling and Characterization of an All-Digital PLL" aims to create a behavioral model of an All-Digital Phase-Locked-Loop (ADPLL). The model should be able to perform accurate and time-effective simulations. Based on the model, a sub-block requirement will be presented as decision basis for test chip manufacturing. READ MORE