PCBA verification and fault detection using a low-frequency GMR-based near-field probe with magnetic closed-loop feedback compensation : A non-contact alternative to physical probing

Abstract: As electronics are getting both smaller and more advanced, the need to verify and validate remains and the means are getting more complex the more functions and components are added. Traditionally, in-circuit tests (ICTs) are performed by probing dedicated test points on the Printed Circuit Board Assembly (PCBA) in a test sequence that is unique to each product. But as the density of components increases, the choice between component and test point must be considered. Instead of decreasing the reliability during verification by having to remove less system-critical test points, this thesis suggests the use of a near-field probe (NFP) based around a Giant Magneto-Resistance (GMR) sensor to possibly replace the need for a physical test point by instead performing contactless testing. The use of a GMR sensor allows for bandwidth from 0 Hz up to the MHz range, whereas commercial NFPs are based on a different technique and are operational from the MHz range and up. The goal of this project was to improve the non-linearity of typically 15% present in the AAH002-02 model from NVE by the use of an analogue closed-loop magnetic feedback circuit. The project successfully improved the linearity to 99.8% by the use of an instrumentation amplifier, a subtractor and a push-pull amplifier in conjunction with a 3x30 turn planar coil embedded in a PCB, located beneath the sensor Integrated Circuit (IC). The resulting linearity was verified by a Helmholtz coil where a uniform magnetic field was produced with linearly increased field strength, and calculated using the R2 value from a linear regression analysis on the acquired data. In the future, the data acquired from this kind of NFP could be used together with a Machine Learning (ML) model to remove the manual labour required when constructing these product-unique test sequences.