GaN-nanowire as probe for scanning tunneling microscopy

Abstract: Scanning tunneling microscope (STM) has in recent years been one of the most used microscopy approaches in surface science. The STM probe allows for the investigation of atomic resolution electrical properties of a material, these probes are usually of metallic characters. In this project, efforts have been made to investigate how good semi-conducting materials are as scanning probes. GaN-nanowires are used as probes for scanning tunneling microscopy, where a single GaN-nanowire was positioned on top of a tungsten tip, using a nanowire manipulator.