Electrical analysis of interface recombination of thin-film CIGS solar cells

Abstract: In this master thesis, electrical characterization of thin film CuInxGa(1−x)Se2 solar cells produced by Midsummer AB were performed with the aim of determining the dominant recombination path of these cells. Current-Voltage (IV), Quantum Effinciency (QE), temperature dependent IV (IVT) and Drive-Level Capacitance Profiling (DLCP) was used with the objective to investigate the dominant recombination path as well as provide some insight of the solar cells in order to create a baseline model using the modelling software SCAPS (Solar cell CAPacitance Simulator). The IV produced mostly consistent results with slight variation, most likely due to non uniformity of equipment. The QE showed consistent results between all cells indicating a stable process for the sample preparation. Using IVT measurements were taken from a temperature of 115K −300K in order to obtain the activation energy for the dominant recombination path. By comparing it with the band gap energy from the QE measurement, it was found that the dominant recombination path is in either the space charge region or in the bulk of the CIGS and not at the hetero interface. DLCP measurement were made at both low temperature and at room temperature and revealed that the cells had a similar doping as other comparable cells at 7×1016cm−3 . The initial baseline model created in SCAPS show a good agreement with the measured IV and currently indicates a spike in the band alignment, supporting the results for the IVT measurement.