Static and Dynamic Characterization of power semiconductors
Abstract: Characterizing power switches is an indispensable step when designing a converter. This thesisinvestigates ways to achieve static and dynamic characterization of semiconductors for high power applications such as power grid or train traction. The static characterization has been tested with a Keysight B1506A device analyzer. The problems encountered have been analyzed and corrected.Then the design of a high current switching test bench for dynamic characterization is explained. The full-bridge configuration allows controlled and spontaneous commutations so the bench can measure hard and soft switching. The voltage can be up to 10 kV and the current up to 3 kA during the commutation. The choice of the probes is justified. The issues of bandwidth, input impedance and common mode current are taken into account. Data are processed in order to interpolate theswitching loss in hard and soft switching.
AT THIS PAGE YOU CAN DOWNLOAD THE WHOLE ESSAY. (follow the link to the next page)