Measuring the Technical and Process Benefits of Test Automation based on Machine Learning in an Embedded Device
Abstract: Learning-based testing is a testing paradigm that combines model-based testing with machine learning algorithms to automate the modeling of the SUT, test case generation, test case execution and verdict construction. A tool that implements LBT been developed at the CSC school at KTH called LBTest. LBTest utilizes machine learning algorithms with off-the-shelf equivalence- and model-checkers, and the modeling of user requirements by propositional linear temporal logic. In this study, it is be investigated whether LBT may be suitable for testing a micro bus architecture within an embedded telecommunication device. Furthermore ideas to further automate the testing process by designing a data model to automate user requirement generation are explored.
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