Essays about: "Photoluminescence Mapping"

Found 3 essays containing the words Photoluminescence Mapping.

1. 1. Photoluminescence Mapping of Erbium Doped Lithium Niobate

   University essay from KTH/Tillämpad fysik

   Author : Chuanshi Xie; [2023]
   Keywords : Automotive mapping; Erbium emitters; Ion implantation; Lithium niobate on insulator; photoluminescence microscopy; Automatisk kartläggning; Erbium fotonemitterare; Jonimplantation; Litiumniobat på isolator; fotoluminiscensmikroskopi.;

   Abstract : Lithium niobate (LiNbO3) is a human-made crystalline which is widely used in modern photonics due to its useful properties. In recent years, there has been significant progress in the development of lithium niobate on insulator (LNOI) technology, realizing a fully functional photonic integrated circuits, thanks to its capabilities in both electro-optics and second-order optical nonlinearity. READ MORE

3. 2. Construction of a scanning confocal microscope for Quantum Dot mapping at telecom wavelength

   University essay from KTH/Tillämpad fysik

   Author : Alexandros Bampis; [2023]
   Keywords : Nanophotonics; Quantum Dot Positioning; Photoluminescence Mapping; Scanning Microscope; Nanofotonik; Positionering av kvantprickar; Fotoluminescenskartläggning; Skanningsmikroskop;

   Abstract : Future commercial applications making use of non-classical light sources require bright quantum emitters. Such emitters can be achieved by embedding self-assembled, optically active semiconductor quantum dots (QDs) in centered photonic structures. READ MORE

4. 3. Properties of III-V semiconductor materials grown by HVPE

   University essay from KTH/Skolan för informations- och kommunikationsteknik (ICT)

   Author : Stamoulis Stergiakis; [2016]
   Keywords : ;

   Abstract : This thesis focuses on the characterization of lll-V semiconductor materials by using Scanning Electron Microscopy equipped with Energy Dispersive Spectroscopy (SEM-EDS), High Resolution X-ray Diffraction (HRXRD), Atomic Force Microscopy (AFM) and Photoluminescence (PL). In XRD characterization, the rocking curve measurement was conducted to evaluate the composition of III-V semiconductor alloys and the Reciprocal Lattice Mapping (RLM) revealed the detailed structural properties of heteroepitaxial III-V semiconductors. READ MORE