Essays about: "Daniel Ahlström"

Found 1 essay containing the words Daniel Ahlström.

  1. 1. Minimizing memory requirements for deterministic test data in embedded testing

    University essay from Institutionen för datavetenskap; Tekniska högskolan

    Author : Daniel Ahlström; [2010]
    Keywords : deterministic test patterns; deterministic test data; embedded testing; minimizing memory; boundary scan; multiple components; components of same type; duplication of test data; jtag; ieee 1149; concatenator; concatenation of test patterns;

    Abstract : Embedded and automated tests reduce maintenance costs for embedded systems installed in remote locations. Testing multiple components of an embedded system, connected on a scan chain, using deterministic test patterns stored in a system provide high fault coverage but require large system memory. READ MORE