Statistical Analysis of ComponentVariations within Electronics

Abstract: Electronics engineers rely on component tolerances to create functional designs. It isimportant to be aware that each component brings some uncertainty to the functionality ofthe assembly and therefore to the performance. To deal with this problem there are differentapproaches within the tolerance analysis field. Currently Veoneer uses the Worst CaseCircuit Analysis methodology that assumes that the worst scenario for every componentis possible, achieving very safe but pessimistic results. Electronics design can therefore beoptimized through statistical analysis.This work focuses on modelling the variance in the performance of a set of electroniccomponents that compose a device or assembly by means of statistical techniques. It usesdifferent methodologies to find models to explain the behaviour of these assemblies andit tests its results through different statistical tests to decide which one performs the best.From this point the work is focused upon finding the tolerance limits that are optimalfor the design while fulfilling safety requirements imposed by the automotive regulatorybody. The result obtained substantially improves the previousWorst Case Circuit Analysismodel while being as safe as required. This is a methodology that does not require of hugeamounts of data; making the process affordable for industry. Finally, it can be concludedthat statistical tolerance analysis can improve substantially the current results and boost thedesign of safety elements in electronics in the automotive industry while being as reliableas always.