Essays about: "Single-Event Upset"

Showing result 6 - 6 of 6 essays containing the words Single-Event Upset.

  1. 6. Equipment for measuring cosmic-ray effects on DRAM

    University essay from Institutionen för systemteknik

    Author : Per-Axel Jonsson; [2007]
    Keywords : DRAM; memory; SEU; single event upset; soft error; FPGA; cosmic radiation;

    Abstract : Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. READ MORE