Essays about: "Single-Event Upset"
Showing result 6 - 6 of 6 essays containing the words Single-Event Upset.
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6. Equipment for measuring cosmic-ray effects on DRAM
University essay from Institutionen för systemteknikAbstract : Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. READ MORE