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  1. 1. Characterization of SiGe layers grown by Trisilane and Germane at low temperatures for BiCMOS application

    University essay from KTH/Skolan för informations- och kommunikationsteknik (ICT)

    Author : Carmine Cappetta; [2014]
    Keywords : ;

    Abstract : Low temperature epitaxy (LTE) of SiGe by chemical vapor deposition (CVD) has attracted dramatic attention during the last decade for CMOS and BiCMOS application. LTE relates to a temperature range of 350÷650 °C. READ MORE