Essays about: "SRAM"
Showing result 16 - 20 of 23 essays containing the word SRAM.
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16. Dessign and Implementation of Hardened Reconfiguration Controller for Self-Healing Systems on SRAM-Based FPGAs
University essay from KTH/Skolan för informations- och kommunikationsteknik (ICT)Abstract : As digital systems become large and complex, their dependability is getting more important, particularly in mission-critical and safety‐critical applications. Among various available platforms for implementing a digital system, SRAM-based Field Programmable Gate Arrays (FPGAs) are increasingly adopted in embedded systems due to their flexibility in achieving multiple requirements such as low cost, high performance, and fast turnaround time compared to Fixed Application Specific Integrated Circuits (ASICs). READ MORE
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17. Multilevel Gain Cell Arrays for Fault-Tolerant VLSI Systems
University essay from ElektroniksystemAbstract : Embedded memories dominate area, power and cost of modern very large scale integrated circuits system on chips ( VLSI SoCs). Furthermore, due to process variations, it becomes challenging to design reliable energy efficient systems. Therefore, fault-tolerant designs will be area efficient, cost effective and have low power consumption. READ MORE
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18. Design and Evaluation of A Low-Voltage, Process-Variation-Tolerant SRAM Cache in 90nm CMOS Technology
University essay from Institutionen för systemteknikAbstract : This thesis presents a novel six-transistor SRAM intended for advanced microprocessor cache application. The objectives are to reduce power consumption through scaling the supply voltage and to design a SRAM that is fully process-variation-tolerant, utilizing separate read and write access ports as well as exploiting asymmetry. READ MORE
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19. Equipment for measuring cosmic-ray effects on DRAM
University essay from Institutionen för systemteknikAbstract : Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. READ MORE
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20. Evaluation of A Low-power Random Access Memory Generator
University essay from Institutionen för systemteknikAbstract : In this work, an existing RAM generator is analysed and evaluated. Some of the aspects that were considered in the evaluation are the optimization of the basic SRAM cell, how the RAM generator can be ported to newer technologys, automating the simulation process and the creation of the workflow for the energy model. READ MORE
