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1. 1. On-Chip Phase Measurement Design Study in 65nm CMOS Technology

   University essay from Linköpings universitet/Elektroniska Kretsar och System; Linköpings universitet/Tekniska fakulteten

   Author : Daniyal Haider; [2015]
   Keywords : BIST; Vernier Oscillators; SAFF; Built-in-Jitter-Measurement; Timing Amplifier.;

   Abstract : Jitter is generally defined as a time deviation of the clock waveform from its desired position. The deviation which occurs can be on the leading or lagging side and it can be bounded (deterministic) or unbounded (random). Jitter is a critical specification in the digital system design. There are various techniques to measure the jitter. READ MORE