Essays about: "IEEE Std. 1687"
Found 3 essays containing the words IEEE Std. 1687.
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1. On-chip Instrument Access Through System Hierarchy
University essay from Lunds universitet/Institutionen för elektro- och informationsteknikAbstract : There are many advantages with the development towards Integrated Circuits (ICs) with smaller, faster, and more transistors. However, tighter margins lead to a need of on-chip instruments to test, tune, and configure. These on-chip instruments, which can be in the range of thousands per IC, must be accessed through the life-time. READ MORE
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2. Test and Repair of Reconfigurable On-chip Instrument Access Networks
University essay from Lunds universitet/Institutionen för elektro- och informationsteknikAbstract : As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become harder to avoid malfunctioning. Embedded instruments are increasingly used to test, tune, and configure the transistors in ICs. IEEE Std.1149. READ MORE
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3. Reconfigurable Instrument Access Network with a Functional Port Interface
University essay from Lunds universitet/Institutionen för elektro- och informationsteknikAbstract : The ever-increasing need for higher performance and more complex functionality pushes the electronics industry to find a faster and more efficient way to test and debug an Integrated Circuit (IC). Currently, the IEEE Std. 1149.1, known as Joint Test Action Group (JTAG) is considered as state of the art by the industry. READ MORE
