Essays about: "Thin film multilayers"

Found 4 essays containing the words Thin film multilayers.

  1. 1. Improving polarizing neutron optics by introducing 11B4C as interlayers

    University essay from Linköpings universitet/Tunnfilmsfysik

    Author : Martin Falk; [2023]
    Keywords : Thin film multilayers; Neutron optics; Neutron polarization;

    Abstract : In this report, the effects of adding 11B4C as interlayers into Fe/Si multilayers is studied. Fe/Si multilayers are commonly used for neutron polarization at large research facilities, and improving the polarizing properties would improve their efficiency. READ MORE

  2. 2. Finite-size effect in CoAlZr/AlZr multilayers

    University essay from Uppsala universitet/Materialfysik

    Author : Fredrik Backer-Meurke; [2018]
    Keywords : Magnetism; thin film; Co; AlZr; Magnetic materials;

    Abstract : The structural and magnetic properties of amorphous Cox(Al80Zr20)1-x multilayers with varying thicknesses of the magnetic bilayers have been investigated. The reduction of the thickness causes a reduction of the critical temperature, Tc, this is known as the finite-size effect. READ MORE

  3. 3. Growth of Pt/Mg Multilayer X-ray Mirrors : Effects of Sputter Yield Amplification

    University essay from Institutionen för fysik, kemi och biologi

    Author : Hafiz Muhammad Sohail; [2009]
    Keywords : Multilayer; X-ray mirror; Pt Mg; DC magnetron sputtering; sputter yield amplification; backscattered neutrals; X-ray reflectivity; XRD; TRIM; IMD.;

    Abstract : This thesis report is focused on the growth of Pt/Mg multilayers and the studies of the sputter yield amplification effect in these. The main application is to use the multilayers as X-ray mirrors reflecting an X-ray wavelength of 17 Å. READ MORE

  4. 4. First-principle of Sc / Cr multilayers for x-ray mirrors applications

    University essay from Institutionen för fysik, kemi och biologi

    Author : Jonatan Abramsson; [2008]
    Keywords : Sc; Cr; Interface; x-ray miror;

    Abstract : In order to produce x-ray mirrors the Thin Film Physics group at IFM grows Cr/Sc multilayers, with a typical thickness of the individual layers in the range 5-20 Å, and with as many periods as possible (a few hundred). The quality of the multilayer interfaces is crucial for their performance as mirrors. READ MORE